Self testing circuit for power optimization
AssigneeSanDisk Technologies LLC
InventorsAmandeep Kaur, Sridhar Yadala, Jayanth Mysore Thimmaiah, Ravindra Arjun Madpur
Life of this patent
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Abstract
Disclosed is an apparatus including a datapath and a test circuit. The datapath is configured to transfer data between a memory core and an IO interface. The datapath includes a plurality of circuits, and a memory core interface. The plurality of circuits operates according to a supply voltage. The test circuit is coupled to the datapath, and configured to determine, from a set of operable voltage levels of the supply voltage, a first minimum operable voltage level for the datapath to operate for the data traversing the datapath at a first frequency.
Claims22
An apparatus comprising:
- a datapath to transfer data between a memory core and an IO interface, the datapath including a plurality of circuits, and a memory core interface, the plurality of circuits operating according to a supply voltage;
- and
- a test circuit coupled to the datapath, the test circuit configured to determine, from a set of operable voltage levels supported by the supply voltage, a first minimum operable voltage level for the datapath to operate for the data traversing the datapath at a first frequency.
A system comprising:
- a voltage supply circuit to generate a supply voltage;
- a datapath to transfer data between a memory core and an IO interface, the datapath including a plurality of circuits and a memory core interface, the plurality of circuits operating according to the supply voltage;
- and
- a storage configured to store:
- a first minimum operable voltage level, from a set of operable voltage levels of the supply voltage, associated with a first frequency, the datapath operable at the first minimum operable voltage level for the data traversing the datapath at the first frequency, and
- a second minimum operable voltage level, from the set of operable voltage levels of the supply voltage, associated with a second frequency, the datapath operable at the second minimum operable voltage level for the data traversing the datapath at the second frequency.
A method comprising:
- determining a frequency of input data received at a datapath between a memory core and an IO interface;
- retrieving a minimum operable voltage level associated with the frequency of the input data from a set of operable voltage levels of a supply voltage;
- and
- supplying, to the datapath, the supply voltage at the retrieved minimum operable voltage level.
A device comprising:
- means for determining a frequency of input data received at a datapath between a memory core and an IO interface;
- means for retrieving a minimum operable voltage level associated with the frequency of the input data from a set of operable voltage levels of a supply voltage;
- and
- means for supplying, to the datapath, the supply voltage at the retrieved minimum operable voltage level.
Dependencies are inferred from the claim text.