Aging Test Method and Aging Test System for Light Emitting Device

An aging test system for a light emitting device, comprising:

• a collection unit configured to collect, in an aging process applied to the light emitting device, an initial value of a first characteristic parameter of the light emitting device and an initial test time point corresponding to the initial value, and collect a current value of the first characteristic parameter and a test time point corresponding to the current value, wherein the test time point corresponding to the current value is different from the initial test time point;
• a generation unit configured to generate a feature line according to the initial value, the current value, the initial test time point and the test time point corresponding to the current value, and calculate a slope of the feature line;
• a determining unit configured to determine whether the slope of the feature line is greater than or equal to a predetermined threshold and less than 0, and trigger, when it is determined that the slope of the feature line is less than the predetermined threshold, the collection unit to continue to collect the current value of the first characteristic parameter and the test time point corresponding to the current value;
• a setting unit configured to replace, when it is determined by the determining unit that the slope of the feature line is greater than or equal to 0, the initial value with the current value, replace the initial test time point with the test time point corresponding to the current value, and trigger the collection unit to continue to collect the current value of the first characteristic parameter and the test time point corresponding to the current value;
• and
• an aging controller configured to terminate the aging process applied to the light emitting device when it is determined by the determining unit that slope of the feature line is greater than or equal to the predetermined threshold and less than 0.