Systems and methods for on-chip time-domain reflectometry

A method for determining a location of a defect in an electrical line of an electronic system, the method comprising:

• (i) setting a value of a first threshold and a value of a second threshold;
• (ii) outputting a first signal transition onto the electrical line;
• (iii) receiving a second signal transition arising in response to a reflection of the first signal transition from the defect;
• (iv) determining an occurrence of a first event based on the first signal transition crossing a first threshold;
• (v) determining an occurrence of a second event based on the second signal transition crossing a second threshold;
• (vi) varying the value of the first threshold and/or the value of the second threshold;
• (vii) repeating (ii)-(vi) N times, wherein N>0;
• (viii) computing a first representative measurement value based on at least some of the occurrences of the first events and computing a second representative measurement value based on at least some of the occurrences of the second events;
• and
• (ix) determining the location of the defect based on the first representative measurement value and the second representative measurement value.

An apparatus for determining a location of a defect in an electrical line of an electronic system, the apparatus comprising:

• a control circuit configured to:
• output a first signal transition onto the electrical line;
• receive a second signal transition arising in response to a reflection of the first signal transition from the defect;
• determine an occurrence of a first event based on the first signal transition crossing a first threshold;
• determine an occurrence of a second event based on the second signal transition crossing a second threshold;
• and
• determine the location of the defect based on a timing of the occurrence of the first event and a timing of the occurrence of the second event.