Dis-engaging test point

A test point circuit comprising:

• a main RF signal path,
• a test point structure having a center conductor and a grounded sleeve, the test point structure being configured for connecting to a test probe for monitoring an RF signal carried through the main RF signal path,
• a test point RF signal circuit connecting the main RF signal path to the test point structure, the test point RF signal circuit comprising a switch,
• wherein, in an open position of the switch, the RF signal in the main RF signal path is prevented from propagating through the test point RF signal circuit and to the test point structure, and, in a closed position of the switch, the RF signal can propagate from the main RF signal path to the test point RF signal circuit and the test point structure such that the test probe connected to the test point structure can be used to measure the RF signal,
• a means for detecting the presence of the test probe when the test probe is mated to the test point structure, and
• a linkage connected between the detecting means and the switch, wherein the linkage is configured to close the switch when the detecting means detects the presence of the test probe when the test probe is mated to the test point structure.