Testing apparatus and control method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsSeung Hyun KIM, Kyu Youn HWANG
Life of this patent
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Abstract
A testing apparatus and control method thereof are provided. The testing apparatus includes a detector configured to measure optical characteristic values on a control line and a test line formed on a reactor; and a controller configured to obtain an optical characteristic value measured, by the detector, on the control line, determine a reaction time corresponding to the optical characteristic value measured on the control line based on predetermined reaction time information, and determine a measurement time at which the detector is to measure another optical characteristic value on the test line based on the reaction time that is determined
Claims20
A testing apparatus comprising:
- a detector configured to measure optical characteristic values on a control line and a test line formed on a reactor;
- and
- a controller configured to:
- obtain an optical characteristic value measured, by the detector, on the control line;
- determine a reaction time corresponding to the optical characteristic value measured on the control line based on predetermined reaction time information;
- and
- determine a measurement time at which the detector is to measure another optical characteristic value on the test line based on the reaction time that is determined.
A control method of a testing apparatus, the control method comprising:
- obtaining, by the testing apparatus, predetermined reaction time information for a control line;
- measuring, by the testing apparatus, an optical characteristic value on the control line;
- determining, by the testing apparatus, a reaction time corresponding to the optical characteristic value measured on the control line based on the predetermined reaction time information;
- and
- determining, by the testing apparatus, a measurement time at which the testing apparatus is to measure another optical characteristic value on a test line based on the reaction time.
A device comprising:
- a memory configured to store instructions;
- and
- at least one processor configured to execute the instructions to:
- obtain a measured optical characteristic value of a substance formed on a control line of a reactor;
- determine a reaction time corresponding to the measured optical characteristic value of the substance formed on the control line of the reactor based on the measured optical characteristic value and predetermined reaction time information;
- determine a measurement time at which to measure another optical characteristic value of another substance formed on a test line of the reactor based on the reaction time;
- and
- measure the other optical characteristic value of the other substance based on the measurement time.
Dependencies are inferred from the claim text.