Microparticle measuring device and microparticle measuring method
AssigneeSony Corporation
InventorKATSUTOSHI TAHARA
Life of this patent
Estimating the term…
Abstract
The present technology provides a technology of improving measurement efficiency in microparticle measurement for optically measuring a characteristic of a microparticle. For this, in the present technology, there is provided a microparticle measuring device and the like provided with a detecting unit which detects light from a microparticle sent from one of a plurality of containers containing microparticles, and an information processing unit which controls to specify a feature amount related to a detection number in a certain time section on the basis of information detected by the detecting unit, determine that the feature amount is abnormal on the basis of a predetermined threshold, and finish detection for the one container.
Claims16
A microparticle measuring device comprising:
- a detecting unit which detects light from a microparticle sent from one of a plurality of containers containing microparticles;
- and
- an information processing unit which controls to specify a feature amount related to a detection number in a certain time section on a basis of information detected by the detecting unit, determine that the feature amount is abnormal on a basis of a predetermined threshold, and finish detection for the one container.
A microparticle measuring method comprising:
- a detecting step of detecting light from a microparticle sent from one of a plurality of containers containing microparticles;
- and
- an information processing step of controlling to specify a feature amount related to a detection number in a certain time section on a basis of information detected at the detecting step, determine that the feature amount is abnormal on a basis of a predetermined threshold, and finish detection for the one container.
Dependencies are inferred from the claim text.