# US 2019/0174662 A1 · Substrate position detection device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2019/0174662 A1 - Document ID: US20190174662A1 - Status: Published application - Kind: A1 - Application number: 16/258,817 - Filed: 2019-01-28 - Published: 2019-06-06 - Earliest claimed: 2016-07-28 - Assignees: Ckd Corporation - Applicants: CKD Corporation - Inventors: Takahiro Ninomiya; Kensuke Takamura; Nobuyuki Umemura - Web page: https://patentgrep.com/patent/US20190174662A1 ## CPC - H05K 13/081: {Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines} - H05K 13/0812: {the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement} - G01N 21/84: Systems specially adapted for particular applications - H05K 1/0269: {for visual or optical inspection} - H05K 3/0044: {Mechanical working of the substrate, e.g. drilling or punching (H05K3/0008 takes precedence)} - H05K 13/04: Mounting of components {, e.g. of leadless components} - H05K 13/0815: {Controlling of component placement on the substrate during or after manufacturing} - G06T 2207/30141: Printed circuit board [PCB] - H05K 2201/09009: Substrate related - H05K 2201/09918: Optically detected marks used for aligning tool relative to the PCB, e.g. for mounting of components - H05K: PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ## Abstract A substrate position detection device includes: an irradiator that irradiates a predetermined range of a substrate with a predetermined light; an imager that takes an image of the predetermined range of the substrate irradiated with the predetermined light; a moving mechanism that causes a relative movement of the imager and the substrate; and a controller that: detects a position of the substrate by sequentially executing to a plurality of recognition objects on the substrate: a moving process of relatively moving the imager to a position corresponding to a predetermined recognition object among the plurality of recognition objects on the substrate; an imaging process of taking an image of the predetermined recognition object under a predetermined imaging condition; and a recognition process of recognizing the predetermined recognition object based on image data obtained by the imaging process. ## Claims ### Claim 1 A substrate position detection device comprising: an irradiator that irradiates a predetermined range of a substrate with a predetermined light; an imager that takes an image of the predetermined range of the substrate irradiated with the predetermined light; a moving mechanism that causes relative movement of the imager and the substrate; and a controller that: detects a position of the substrate by sequentially executing to a plurality of recognition objects on the substrate: a moving process of relatively moving the imager to a position corresponding to a predetermined recognition object among the plurality of recognition objects on the substrate; an imaging process of taking an image of the predetermined recognition object under a predetermined imaging condition; and a recognition process of recognizing the predetermined recognition object based on image data obtained by the imaging process; after termination of the imaging process on the predetermined recognition object among the plurality of recognition objects, executes the recognition process on the predetermined recognition object, while executing the moving process of relatively moving the imager to a position corresponding to another recognition object different from the predetermined recognition object; and when failing to recognize any recognition object that is not sequentially last among the plurality of recognition objects: causes the moving mechanism to relatively move the imager to a position corresponding to the recognition object that was not recognized, executes a re-imaging process of taking an image of the recognition object again, and executes a re-recognition process of recognizing the recognition object based on image data obtained by the re-imaging process. ### Claim 2 (depends on 1) The substrate position detection device according to claim 1, wherein the controller executes a change process of changing the imaging condition when the re-imaging process is executed. ### Claim 3 (depends on 2) The substrate position detection device according to claim 2, wherein a light intensity of the light emitted from the irradiator is changed as the imaging condition. ### Claim 4 (depends on 2) The substrate position detection device according to claim 2, wherein a radiation angle of the light emitted from the irradiator is changed, or a light source contained in the irradiator to emit the light is changed, as the imaging condition. ### Claim 5 (depends on 3) The substrate position detection device according to claim 3, wherein a radiation angle of the light emitted from the irradiator is changed, or a light source contained in the irradiator to emit the light is changed, as the imaging condition. ### Claim 6 (depends on 2) The substrate position detection device according to claim 2, wherein a color of the light emitted from the irradiator is changed as the imaging condition. ### Claim 7 (depends on 3) The substrate position detection device according to claim 3, wherein a color of the light emitted from the irradiator is changed as the imaging condition. ### Claim 8 (depends on 4) The substrate position detection device according to claim 4, wherein a color of the light emitted from the irradiator is changed as the imaging condition. ### Claim 9 (depends on 5) The substrate position detection device according to claim 5, wherein a color of the light emitted from the irradiator is changed as the imaging condition. ### Claim 10 (depends on 1) The substrate position detection device according to claim 1, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 11 (depends on 2) The substrate position detection device according to claim 2, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 12 (depends on 3) The substrate position detection device according to claim 3, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 13 (depends on 4) The substrate position detection device according to claim 4, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 14 (depends on 5) The substrate position detection device according to claim 5, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 15 (depends on 6) The substrate position detection device according to claim 6, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 16 (depends on 7) The substrate position detection device according to claim 7, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 17 (depends on 8) The substrate position detection device according to claim 8, wherein the substrate is a printed circuit board on which an electronic component is mounted. ### Claim 18 (depends on 9) The substrate position detection device according to claim 9, wherein the substrate is a printed circuit board on which an electronic component is mounted.