# US 2019/0174119 A1 · Adaptable inspection unit for existing processing lines

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- Number: US 2019/0174119 A1
- Document ID: US20190174119A1
- Status: Published application
- Kind: A1
- Application number: 16/257,039
- Filed: 2019-01-24
- Published: 2019-06-06
- Earliest claimed: 2016-07-26
- Assignees: Qcify Inc.
- Applicants: Qcify Inc
- Inventors: Raf Peeters; Bert Peelaers; Bert Switten
- Web page: https://patentgrep.com/patent/US20190174119A1

## CPC

- H04N 13/243: using three or more two-dimensional [2D] image sensors
- G01N 21/84: Systems specially adapted for particular applications
- G01N 21/95: characterised by the material or shape of the object to be examined (G01N21/89 - G01N21/91, G01N21/94 take precedence)
- G06T 7/0004: {Industrial image inspection}
- G06T 7/0008: {checking presence/absence}
- H04N 23/56: provided with illuminating means
- H04N 23/66: Remote control of cameras or camera parts, e.g. by remote control devices
- G01N 2021/845: {Objects on a conveyor}
- G06T 2207/10021: Stereoscopic video; Stereoscopic image sequence
- G06T 2207/30128: Food products
- H04N 13/254: in combination with electromagnetic radiation sources for illuminating objects
- H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL

## Abstract

An adaptable inspection unit includes an attachment mechanism, an inspection sensor device, a data port that is capable of transmitting information, and a power port that is connectable to a power source, all of which are physically connected together. The adaptable inspection unit also includes a memory circuit and a processor circuit. The processing circuit controls the inspection sensor device and writes information transmitted via the data port. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, an adhesive, a magnet, a latch, a lock, a locating pin, a rail, a slide, locking pin, a bolt, a screw, gravity or friction. The attachment mechanism is used to connect the adaptable inspection unit to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.

## Claims

### Claim 1

An adaptable inspection unit, comprising:
an attachment mechanism;
an inspection sensor device;
a data port that is capable of transmitting information; and
a power port that is connectable to a power source, wherein the attachment mechanism, the inspection sensor device, the data port, and the power port are physically connected together.

### Claim 2 (depends on 1)

The adaptable inspection unit of claim 1, further comprising:
a memory circuit; and
a processor circuit adapted to:
control the inspection sensor device; and
cause information to be transmitted via the data port.

### Claim 3 (depends on 1)

The adaptable inspection unit of claim 1, wherein the attachment mechanism is: a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, an adhesive, a magnet, a latch, a lock, a locating pin, a rail, a slide, locking pin, a bolt, an screw, and wherein the attachment mechanism is used to connect the adaptable inspection unit to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.

### Claim 4 (depends on 1)

The adaptable inspection unit of claim 1, wherein the attachment mechanism affixes the adaptable inspection unit to a location proximate to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.

### Claim 5 (depends on 1)

The adaptable inspection unit of claim 1, wherein the adaptable inspection unit communicates with a sorting device via the data port.

### Claim 6 (depends on 5)

The adaptable inspection unit of claim 5, wherein the data port is a wired communication port or a wireless communication port.

### Claim 7 (depends on 1)

The adaptable inspection unit of claim 1, wherein the adaptable inspection unit outputs sample characterization data via the data port.

### Claim 8 (depends on 5)

The adaptable inspection unit of claim 5, wherein the information transmitted by the adaptable inspection unit causes a mode of operation of the sorting device to be performed.

### Claim 9 (depends on 3)

The adaptable inspection unit of claim 3, wherein the processing line is a conveyor.

### Claim 10 (depends on 9)

The adaptable inspection unit of claim 9, wherein the adaptable inspection unit is located above the conveyor.

### Claim 11 (depends on 9)

The adaptable inspection unit of claim 9, wherein the adaptable inspection unit is located proximate to the beginning of the conveyor.

### Claim 12 (depends on 3)

The adaptable inspection unit of claim 3, wherein the processing line is a chute.

### Claim 13 (depends on 12)

The adaptable inspection unit of claim 12, wherein the adaptable inspection unit is located above the chute.

### Claim 14 (depends on 12)

The adaptable inspection unit of claim 12, wherein the adaptable inspection unit is located proximate to the start of the chute.

### Claim 15 (depends on 1)

The adaptable inspection unit of claim 1, wherein the inspection sensor device includes an optical receiver.

### Claim 16 (depends on 1)

The adaptable inspection unit of claim 1, wherein the inspection sensor device includes a plurality of optical receivers.

### Claim 17 (depends on 1)

The adaptable inspection unit of claim 1, wherein the inspection sensor device includes a trigger to determine the presence of a sample.

### Claim 18 (depends on 1)

The adaptable inspection unit of claim 1, wherein the information transmitted via the data port is a sorting command.

### Claim 19 (depends on 1)

The adaptable inspection unit of claim 1, wherein the information transmitted via the data port is a sample characteristic data.

### Claim 20 (depends on 1)

The adaptable inspection unit of claim 1, wherein the information transmitted via the data port is a percentage of samples to be deflected.
