# US 2019/0170819 A1 · Jtag support over a broadcast bus in a distributed memory buffer system

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- Number: US 2019/0170819 A1
- Document ID: US20190170819A1
- Status: Published application
- Kind: A1
- Application number: 15/828,466
- Filed: 2017-12-01
- Published: 2019-06-06
- Earliest claimed: 2017-12-01
- Assignees: International Business Machines Corporation
- Applicants: International Business Machines Corporation
- Inventors: Logan I. Friedman; Nicholas S. Rolfe; Susan M. Eickhoff; Steven R. Carlough; Gary A. Van Huben; Markus Cebulla; Walter Pietschmann
- Web page: https://patentgrep.com/patent/US20190170819A1

## CPC

- G01R 31/3177: Testing of logic operation, e.g. by logic analysers
- G01R 31/31723: {Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes (routing the test signal to or from the device under test G01R31/31926)}
- G01R 31/318597: {JTAG or boundary scan test of memory devices (other scan testing of memories G11C29/32)}
- G11C 29/00: Checking stores for correct operation {; Subsequent repair}; Testing stores during standby or offline operation
- G11C 29/16: using microprogrammed units, e.g. state machines
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G11C: STATIC STORES (semiconductor memory devices H10B)

## Abstract

A method, apparatus and system testing a plurality of semiconductor chips in a distributed memory buffer system is provided. Embodiments of the present invention recognize improvements to testing signals through the chip substrate and motherboard. This invention overloads the shared broadcast bus by using it for test purposes rather than its normal mainline function. One of the main components of this invention is the A/C chip. In test mode, the AC chip converts JTAG commands into an internal test format and sends test data over the shared broadcast bus. Each data chip determines whether the scan data is for itself or if it should ignore it. The corresponding data chip then processes the data, and if necessary sends return data back to the address and command chip, where it is converted back into JTAG format and can be seen by the tester.

## Claims

### Claim 1

A method for testing a plurality of semiconductor chips in a distributed memory buffer system, the method comprising:
receiving a Joint Test Action Group (JTAG) command from a test server;
determining whether the JTAG command is a test request;
responsive to determining the JTAG command is a test request, translating the JTAG command into a test command;
determining whether the test command is for one or more data chips or for an Address and Command (AC) chip;
responsive to determining the test command is for the AC chip, executing the test command;
responsive to determining the test command is for the one or more data chips, sending the test command towards the one or more data chips;
receiving a response to the test command;
translating the response into a JTAG compliant response; and
sending the JTAG compliant response to the test server.

### Claim 2 (depends on 1)

The method of claim 1, wherein sending the JTAG compliant response to the test server further comprises:
routing the JTAG compliant response by a JTAG test port; and
transmitting the response.

### Claim 3 (depends on 1)

The method of claim 1, wherein receiving a JTAG command from the test server, further comprises:
receiving the JTAG command from the test server through a JTAG Automated Test Equipment (ATE).

### Claim 4 (depends on 1)

The method of claim 1, wherein determining whether the test command is for the one or more data chips or for the AC chip, further comprises:
decoding the JTAG command by a JTAG Tap Controller.

### Claim 5 (depends on 1)

The method of claim 1, wherein decoding the JTAG command into a test command, further comprises:
decoding the JTAG command by a JTAG internal test converter into an internal test mode.

### Claim 6 (depends on 1)

The method of claim 1, wherein sending the test command towards the one or more data chips further comprises:
routing the test command through a bus multiplexer to a shared broadcast bus wherein the destination address of the test command can be for a plurality of data chips.

### Claim 7 (depends on 6)

The method of claim 6, wherein receiving the response from the one or more data chips, further comprises:
detecting the enablement of an open-drain line and a driver associated with a data chip wherein the data chip contains a logic to distinguish a destination address of the test command for itself or for another data chip; and
aggregating the response from the data chip.

### Claim 8

An apparatus for testing a plurality of semiconductor chips in a distributed memory buffer system, the apparatus comprising;
an Address and Command (AC) chip;
a Joint Test Action Group (JTAG) Test Access Port (TAP) controller disposed in the AC chip;
a JTAG internal test converter disposed in the AC chip;
a mainline logic disposed in the AC chip;
a JTAG test port connected to the AC chip;
a shared broadcast bus connected to the AC chip;
a return open drain line connected to the AC chip; and
one or more data chips connected to the shared broadcast bus and the return open drain line.

### Claim 9 (depends on 8)

The apparatus of claim 8, wherein the JTAG TAP controller further comprises a logic for determining whether a test command is for the one or more data chips or for the AC chip.

### Claim 10 (depends on 8)

The apparatus of claim 8, wherein the JTAG internal test converter comprises logic for converting a JTAG command into an internal test format.

### Claim 11 (depends on 9)

The apparatus of claim 9, wherein the one or more data chips contain a logic to distinguish a destination address of the test command for a plurality of data chips.

### Claim 12 (depends on 8)

The apparatus of claim 8, wherein the mainline logic comprises of logic for managing a non-test mode commands in a distributed memory buffer system.

### Claim 13 (depends on 8)

The apparatus of claim 8, wherein the shared broadcast bus comprises one or more bits of pathway for a one-way communication between the AC chip and the one or more data chips.

### Claim 14 (depends on 8)

The apparatus of claim 8, wherein the return open drain line comprises a one bit pathway for a one-way communication between the AC chip and one or more data chips.

### Claim 15

A system for testing a plurality of semiconductor chips in a distributed memory buffer system, the system comprising;
an Address and Command (AC) chip;
a Joint Test Action Group (JTAG) Test Access Port (TAP) controller disposed in the AC chip;
a JTAG internal test converter disposed in the AC chip;
a mainline logic disposed in the AC chip;
a JTAG test port connected to the AC chip;
a shared broadcast bus connected to the AC chip;
a return open drain line connected to the AC chip;
one or more data chips connected to the shared broadcast bus and the return open drain line;
a JTAG Automated Test Equipment (ATE) connected to the JTAG test port; and
a test server connected to the JTAG automatic test equipment over a network.

### Claim 16 (depends on 15)

The system of claim 15, wherein a test server comprises a test component, a database and a network device.

### Claim 17 (depends on 15)

The system of claim 15, wherein JTAG ATE comprises a communication pathway between the test server and the AC chip.

### Claim 18 (depends on 15)

The system of claim 15, wherein the network comprises a wireless network and an Ethernet network.

### Claim 19 (depends on 16)

The system of claim 16, wherein the database comprises a relational database for storing a test result of the AC chip and the one or more data chips.

### Claim 20 (depends on 15)

The system of claim 15, wherein the JTAG test port comprises of a component associated with a communication service between the AC chip and the JTAG ATE.