# US 2019/0170799 A1 · Probe for non-intrusively detecting imperfections in a test object

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 2019/0170799 A1
- Document ID: US20190170799A1
- Status: Published application
- Kind: A1
- Application number: 16/199,809
- Filed: 2018-11-26
- Published: 2019-06-06
- Earliest claimed: 2017-12-05
- Assignees: Airbus Helicopters
- Applicants: Airbus Helicopters
- Inventors: Laurent BIANCHI; Sebastien BERNIER; John ENDERBY; Mark BOWES; Dawood PARKER
- Web page: https://patentgrep.com/patent/US20190170799A1

## CPC

- G01R 29/0878: {Sensors; antennas; probes; detectors (wave guide measuring sections G01R1/24)}
- G01N 27/24: Investigating the presence of flaws
- G01R 1/07: Non contact-making probes
- G01R 31/002: {where the device under test is an electronic circuit}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.

## Claims

### Claim 1

A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials, the probe comprising a capacitive measuring apparatus, wherein the capacitive measuring apparatus comprises at least two coplanar electrodes and a separation device, wherein the separation device maintains a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.

### Claim 2 (depends on 1)

The probe of claim 1, further comprising an adjustment device for adjusting a spatial separation between the at least two coplanar electrodes.

### Claim 3 (depends on 1)

The probe of claim 1, further comprising at least two disks for non-intrusively detecting imperfections in test objects with a curved surface, wherein respective disks of the at least two disks form respective ones of the at least two coplanar electrodes.

### Claim 4 (depends on 3)

The probe of claim 3, wherein the at least two disks are mounted parallel to each other on a roller.

### Claim 5 (depends on 4)

The probe of claim 4, further comprising a spring-loaded contact that electrically couples a power source through the roller with at least one of the at least two disks.

### Claim 6 (depends on 1)

The probe of claim 1, wherein the separation device comprises a coating of the at least two coplanar electrodes.

### Claim 7 (depends on 6)

The probe of claim 6, wherein the coating is electrically insulating.

### Claim 8 (depends on 6)

The probe of claim 6, wherein the coating is impervious to water.

### Claim 9 (depends on 6)

The probe of claim 6, wherein the coating comprises at least one of parylene or polytetrafluoroethylene.

### Claim 10 (depends on 1)

The probe of claim 1, wherein the separation device comprises an insulating substrate.

### Claim 11 (depends on 9)

The probe of claim 9, wherein the insulating substrate forms a well that accommodates the at least two coplanar electrodes.

### Claim 12 (depends on 1)

The probe of claim 1, wherein the separation device further comprises a distance measurement apparatus for measuring a distance between the at least two coplanar electrodes and the test object.

### Claim 13 (depends on 12)

The probe of claim 12, wherein the distance measurement apparatus comprises a device based at least on one of an optical or an acoustical interference method.

### Claim 14 (depends on 12)

The probe of claim 12, wherein the separation device further comprises a distance adjustment apparatus for adjusting the substantially constant distance between the at least two coplanar electrodes and the test object based on the distance measured between the at least two coplanar electrodes and the test object with the distance measurement apparatus.

### Claim 15 (depends on 1)

A method for non-intrusively detecting imperfections in a test object using the probe of claim 1 comprising the steps of measuring a capacitance at a predetermined position of the probe relative to the test object, determining a real part and an imaginary part of a complex dielectric constant based on the measured capacitance at the predetermined position, and comparing the real part and the imaginary part of the complex dielectric constant with the real part and the imaginary part of another complex dielectric constant determined using a reference object without imperfections to determine whether the test object has imperfections.