A feature quantity measuring device, comprising:
- an acquiring circuit configured to acquire time series data from a received signal;
- a feature quantity calculating circuit configured to calculate a feature, based on data in a predetermined time span of the time series data;
- a degree of similarity calculating circuit configured to calculate a degree of similarity between the feature based on the data in the time span and supervised data representing a preset feature when there is a long-period variation;
- a long-period variation detecting circuit configured to output a comparison result indicating a magnitude relationship between the degree of similarity and a predetermined threshold value;
- and
- a control circuit configured to determine, based on the comparison result, whether a characteristic of the long-period variation is contained within the time span and, when the characteristic is not contained, output the feature for the time span.