Circuit for Monitoring Transient Time in Analog and Digital Systems

A method for monitoring a transient time in a device under test, the method comprising:

• continuously monitoring, by a monitoring circuit, a voltage waveform of the device under test;
• generating, by a transient edge clipper circuit of the monitoring circuit, a clipped voltage waveform by clipping voltage levels of the voltage waveform that exceed a threshold range;
• generating, by logic circuitry of the monitoring circuit, pulse signal representations of the clipped voltage waveform;
• generating, by the logic circuitry, a time delayed pulse signal by introducing a predetermined time delay into the pulse signal representations;
• converting, by a converter circuit of the monitoring circuit, the time delayed pulse signal into an output current;
• and
• providing, by the converter circuit, the output current for characterization of a transient time.

A system for monitoring a transient time in a device under test, the system comprising:

• a monitoring circuit comprising:
• a transient edge clipper circuit arranged to be electrically coupled to a device under test, the transient edge clipper circuit configured to remove voltage levels of a voltage waveform of the device under test which exceed a threshold range to generate a clipped voltage waveform;
• logic circuitry electrically coupled to the transient edge clipper circuit, the logic circuitry configured to generate a time delayed pulse signal representation of the clipped voltage waveform by injecting a predetermined time delay;
• and
• a converter circuit electrically coupled to the logic circuitry and configured to generate a current signal based on the pulse signal representations.