Blind mate waveguide flange

A testing apparatus configured to test a radar chipset, the testing apparatus including a waveguide fixture to communicate with a test head to provide source, receive, measure, and signal processing capability and a probe card holder to communicate with the radar chipset, the waveguide fixture and the probe card holder configured to be brought into mating contact to convey signals between the test head and the radar chipset for testing,

• at least one of the waveguide fixture and the probe card holder including a plurality of receiving mounts, each receiving mount having a first end and a second end,
• each receiving mount configured to support a blind mate waveguide flange on the first end, the blind mate waveguide flange comprising:
• a mating surface for interfacing with a waveguide probe interface, the mating surface comprising a choke flange and a first opening to one end of a waveguide transition section, the choke flange comprising a choke groove separating a peripheral region of the mating surface from an inner region of the mating surface, wherein the inner region is recessed relative to the peripheral region to provide an air gap upon mating with another mating surface, the first opening having a first shape, and
• a waveguide connection interface comprising a second opening at an opposite end of the waveguide transition section for interfacing with a waveguide, the second opening having a second shape such that the waveguide transition section provides a transition from the first shape to the second shape;
• and
• each receiving mount configured support the waveguide on the second end such that the waveguide passes through the receiving mount to the first end and engages with the waveguide connection interface.