Reconstituted wafer structure
AssigneeRaytheon Company
InventorsHooman Kazemi, Mark Rosker, Thomas E. Kazior, Shane A. O'Connor, Emily Elswick
Life of this patent
Estimating the term…
Abstract
A reconstituted wafer includes a plurality of apertures defined in a first substrate. A module is positioned in each aperture and coupled to circuit traces on the first substrate by operation of beam leads extending from the module. A second substrate is positioned over the first substrate and each module is hermetically sealed in a space defined by the respective aperture and the second substrate. One or more vias are provided to access I/O signals at a surface of the first or second substrates. The modules may include an invariant die where different technologies are stacked together.
Claims43
A wafer structure comprising:
- a first planar structure having a plurality of apertures defined therein;
- at least one module positioned with respect to one of the apertures, the at least one module having a plurality of beam leads coupled to the first planar structure;
- and
- a second planar structure disposed on a first surface of the first planar structure to define a closed space about the at least one module,
- wherein the at least one module comprises:
- a first circuit layer;
- and
- a second circuit layer coupled to the first circuit layer,
- wherein at least one of the first and second circuit layers is coupled to at least one of the plurality of beam leads.
A device, comprising:
- a first planar structure having a first surface;
- a first aperture defined in the first surface of the first planar structure;
- a first module having a plurality of co-planar leads extending therefrom, wherein the plurality of co-planar leads is coupled to the first surface of the first planar structure to position the first module in the first aperture;
- a second planar structure disposed on the first surface of the first planar structure,
- wherein a closed space is defined about the first module by the first and second planar structures and the first aperture.
Dependencies are inferred from the claim text.