Memory device with improved data retention
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGulbagh SINGH, Chen-Hao LI, Chih-Ming LEE, Chi-Yen LIN, Cheng-Tsu LIU
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGulbagh SINGH, Chen-Hao LI, Chih-Ming LEE, Chi-Yen LIN, Cheng-Tsu LIU
Estimating the term…
The present disclosure relates to a memory device that includes a substrate and source and drain regions formed in the substrate. The memory device includes a gate dielectric formed on the substrate and between the source and drain regions. The memory device also includes a gate structure formed on the gate dielectric and the gate structure has a planar top surface. The memory device further includes a multi-spacer structure that includes first, second, and third spacers. The first spacer is formed on a sidewall of the gate structure and a top surface of one of the source and drain regions. The second spacer is formed on a sidewall of the first spacer and the second spacer has a dielectric constant greater than a dielectric constant of the first spacer. The third spacer is formed on a sidewall of the second spacer and a horizontal surface of the first spacer.
A memory device comprising:
A multiple-time programmable (MTP) memory device, comprising:
A method for forming a memory device, comprising:
Dependencies are inferred from the claim text.