Method for inspecting sensor package structure, inspection apparatus, and focus assistant loader of inspection apparatus

A method for inspecting a sensor package structure, comprising:

• implementing a fetching process by using a focus assistant loader to fetch a sensor package structure having a sensor chip, wherein a plurality of focus portions of the focus assistant loader and an image sensing region of the sensor chip face the same direction, and wherein the sensor package structure includes a plurality of test regions respectively located at different heights, the focus portions are arranged outside the sensor package structure, and positions of the focus portions respectively correspond to the heights of the test regions;
• and
• implementing an inspecting process by using a plurality of cameras to respectively focus on the focus portions, and then using the cameras to respectively capture images of the test regions for obtaining image information of each of the test regions.