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US 2019/0164849 A1Published application
Electronic device and electrical testing method thereof
AssigneeNanya Technology Corporation
InventorsCHIH-YING CHANG, JUI-HSIU JAO
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Abstract
An electronic device includes a substrate, an electronic component disposed over the substrate and an electrical testing component disposed over the substrate. The electronic component includes a bottom plate over the substrate, and a top plate over the bottom plate. The electrical testing component includes a first anti-fuse structure and a second anti-fuse structure, wherein the first anti-fuse structure and the second anti-fuse structure are electrically connected to the bottom plate.
Claims10
An electronic device, comprising:
- a substrate;
- an electronic component disposed over the substrate, wherein the electronic component comprises:
- a bottom plate over the substrate;
- and
- a top plate over the bottom plate;
- and
- an electrical testing component disposed over the substrate,
- wherein the electrical testing component is fusible in order to be selectively electrically connected to the bottom plate of the electronic component.
5 more elements
An electric testing method, comprising:
- providing an electronic device, comprising:
- an electronic component, wherein the electronic component comprises:
- a bottom plate;
- and
- a top plate over the bottom plate;
- and
- an electrical testing component, comprising:
- a first anti-fuse structure;
- and
- a second anti-fuse structure;
- applying a first voltage to the first anti-fuse structure and a second voltage to the second anti-fuse structure, in order to electrically connect the first anti-fuse structure and the second anti-fuse structure to the bottom plate;
- and
- testing the electronic component by applying a third voltage to one of the first anti-fuse structure and the second anti-fuse structure and a fourth voltage to the top plate.
10 more elements
Dependencies are inferred from the claim text.