Die separation using adhesive-layer laser scribing
AssigneeNXP B.V.
InventorsSiriluck Wongratanaporngoorn, Yao Jung Chang, Ekapong Tangpattanasaeree, Paradee Jitrungruang, Pitak Seantumpol
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AssigneeNXP B.V.
InventorsSiriluck Wongratanaporngoorn, Yao Jung Chang, Ekapong Tangpattanasaeree, Paradee Jitrungruang, Pitak Seantumpol
Estimating the term…
A method for wafer dicing and removing separated integrated circuit (IC) dies from a carrier substrate includes mounting a wafer on a substrate using an adhesive layer, laser scribing the adhesive layer to create defect regions in the adhesive layer, and performing a breaking step to separate the laser-scribed adhesive layer into separated adhesive portions corresponding to the IC dies. For a stealth-dicing (SD) technique, defect regions also are created in the wafer using a laser and the breaking step is an expansion step that simultaneously separates the dies and corresponding portions of adhesive. For a dice-before-grind (DBG) technique, the dies are separated by backside grinding before the breaking step. Efficient adhesive-layer separation is achieved with reduced backside chipping associated with conventional blade dicing.
A method for manufacturing integrated circuit (IC) dies, the method comprising:
(canceled)
A method of separating adjacent integrated circuit (IC) dies formed on a semiconductor wafer, the method comprising:
The method of claim 17, wherein the laser-scribed defect regions in the adhesive layer correspond to the cut lines in the wafer.
A method of separating adjacent integrated circuit (IC) dies formed on a semiconductor wafer, the method comprising:
Dependencies are inferred from the claim text.