Blocking Structures on Isolation Structures
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYu-Hsuan Yang, Wen Han Hung, Tzy-Kuang Lee, Chia Ying Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYu-Hsuan Yang, Wen Han Hung, Tzy-Kuang Lee, Chia Ying Lin
Estimating the term…
A method for fabricating a semiconductor device includes forming a plurality of isolation structures in a semiconductor substrate and forming a plurality of blocking structures over the isolation structures. The blocking structures have a lower reflectivity than the isolation structures. The method further includes forming a photoresist layer on the semiconductor substrate, exposing the photoresist layer to a light source through a mask, and developing the photoresist layer to create a patterned photoresist feature that covers a first region of a portion of the semiconductor substrate between two of the isolation structures. The portion of the semiconductor substrate having a second region that is exposed.
A method for fabricating a semiconductor device, the method comprising:
A method of fabricating a semiconductor device comprising:
18-20. (canceled)
A method for fabricating a semiconductor device, the method comprising:
Dependencies are inferred from the claim text.