Methods of scrubbing errors and semiconductor modules using the same
AssigneeSK hynix Inc.
InventorsYoung Ook SONG, Yong Mi KIM, Chang Hyun KIM
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a flag generation circuit and a write operation circuit. The flag generation circuit generates an error scrub flag if an error scrub operation is performed. The write operation circuit controls a write operation in response to the error scrub flag. The error scrub operation includes an internal read operation for outputting read data from a cell array, a data correction operation for correcting an error included in the read data to generate corrected data, and an internal write operation for storing the corrected data into the cell array.
Claims20
A semiconductor module comprising:
- a controller configured to control an error scrub operation and a read operation;
- and
- a semiconductor device including a plurality of memory chips,
- wherein at least one of the plurality of memory chips performs the error scrub operation during the read operation of the plurality of memory chips.
A method of scrubbing errors, the method comprising:
- a first step of performing an error scrub operation of any one selected from a plurality of memory chips during a read operation of the plurality of memory chips;
- and
- a second step of performing the error scrub operation of at least one of the memory chips remaining after excluding the selected memory chip from the plurality of memory chips.
A semiconductor module comprising:
- a controller including an error scrub control circuit and configured to control an error scrub operation and a read operation;
- and
- a semiconductor device operatively coupled to the controller and including a plurality of memory chips,
- wherein the error scrub control unit is configured to control the plurality of memory chips so that at least one of the plurality of memory chips performs an error scrub operation during a read operation of the plurality of memory chips.
Dependencies are inferred from the claim text.