Semiconductor device and failure detection method of the semiconductor device

A failure detection method of a semiconductor device that includes a first processor that performs a predetermined interrupt in response to an interrupt request, a plurality of circuit blocks, each outputting an interrupt signal, a first interrupt control circuit that receives the interrupt signals from the circuit blocks and outputs the interrupt request to the first processor and at least one interrupt monitoring circuit that corresponds to at least one of the interrupt signals and includes a setting circuit for setting a monitoring type and first and second monitoring periods, the monitoring type indicating a monitoring state of the corresponding interrupt signal, the method comprising:

• under control of the interrupt monitoring circuit,
• setting the monitoring type and the first and second monitoring periods in the setting circuit;
• starting monitoring the interrupt signal according to the setting of the monitoring type;
• if the monitoring type indicates an asserted state of the interrupt signal, monitoring the asserted state;
• comparing a first duration of the continuous asserted state and a first monitoring period to detect a failure if the first duration exceeds the first monitoring period;
• if the monitoring type indicates a negated state of the interrupt signal, monitoring the negated state;
• and
• detecting a failure if a second duration of the continuous negated state exceeds a second monitoring period.

A failure detection method of a semiconductor device having a first circuit hierarchy and a second circuit hierarchy, the first circuit hierarchy including a plurality of processors that perform a predetermined interrupt in response to an interrupt request, a plurality of circuit blocks, each outputting an interrupt signal, an interrupt control circuit that receives the interrupt signals from the circuit blocks and outputs the interrupt request to one of the processors and at least one interrupt monitoring circuit that corresponds to at least one of the interrupt signals and includes a setting circuit for setting a monitoring type and first and second monitoring periods, the monitoring type indicating a monitoring state of the corresponding interrupt signal, the method comprising:

• performing a predetermined operation check test on each of the first and second circuit hierarchies at startup of the semiconductor device;
• normally activating the semiconductor device in absence of abnormality in the operation check test;
• in the normal operation, monitoring, by the interrupt monitoring circuit, the interrupt signal from the second circuit hierarchy to the first circuit hierarchy;
• under control of the interrupt monitoring circuit,
• if the monitoring type indicates an asserted state of the interrupt signal and a first duration of the continuous asserted state exceeds the first monitoring period, detecting the state as a failure;
• and
• if the monitoring type indicates a negated state of the interrupt signal and a second duration of the continuous negated state exceeds the second monitoring period, detecting the state as a failure.