Method and system for thermal drift correction
AssigneeSynaptics Incorporated
InventorsTom R. Vandermeijden, Sam Toba
Life of this patent
Estimating the term…
Abstract
A method includes obtaining various resistance measurements of a sensor electrode in an input device, where the resistance measurements correspond to electrical resistance values across the sensor electrode. The method further includes obtaining a capacitive response using various sensor electrodes in the input device, where the capacitive response corresponds to changes in capacitance in response to an input object being located in a sensing region. The method further includes determining an adjusted capacitive response using the resistance measurements and the capacitive response. The method further includes determining, using the adjusted capacitive response, object information regarding the input object in the sensing region.
Claims20
A processing system, comprising:
- sensor circuitry configured to:
- obtain a first plurality of resistance measurements of a sensor electrode in an input device, wherein the first plurality of resistance measurements correspond to electrical resistance values across the sensor electrode, and
- obtain a capacitive response using a plurality of sensor electrodes in the input device, wherein the capacitive response corresponds to a plurality of changes in capacitance in response to an input object being located in a sensing region;
- and
- a determination module coupled to the sensor circuitry, the determination module configured to:
- determine a first adjusted capacitive response using the first plurality of resistance measurements and the capacitive response, and
- determine, using the first adjusted capacitive response, object information regarding the input object in the sensing region.
An input device, comprising:
- a plurality of sensor electrodes comprising a sensor electrode;
- and
- a processing system coupled to the plurality of sensor electrodes, the processing system configured to:
- obtain a first plurality of resistance measurements of the sensor electrode, wherein the first plurality of resistance measurements correspond to electrical resistance values across the sensor electrode;
- obtain a capacitive response using the plurality of sensor electrodes, wherein the capacitive response corresponds to a plurality of changes in capacitance in response to an input object being located in a sensing region;
- determine an adjusted capacitive response using the first plurality of resistance measurements and the capacitive response;
- and
- determine, using the adjusted capacitive response, object information regarding the input object in the sensing region.
A method, comprising:
- obtaining a first plurality of resistance measurements of a sensor electrode in an input device, wherein the first plurality of resistance measurements correspond to electrical resistance values across the sensor electrode;
- obtaining a capacitive response using a plurality of sensor electrodes in the input device, wherein the capacitive response corresponds to a plurality of changes in capacitance in response to an input object being located in a sensing region;
- determining an adjusted capacitive response using the first plurality of resistance measurements and the capacitive response;
- and
- determining, using the adjusted capacitive response, object information regarding the input object in the sensing region.
Dependencies are inferred from the claim text.