Semiconductor device and current adjustment method in semiconductor device
AssigneeRenesas Electronics Corporation
InventorsSachiko NISHINO, Masashi HIRANO, Seiji KOBAYASHI
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Abstract
There is provided a semiconductor device capable of equalizing a chip temperature while suppressing variation in electrical stress applied to each circuit at the time of a burn-in test. A semiconductor device according to one embodiment includes a current adjustment circuit capable of adjusting a current amount flowing in the current adjustment circuit itself, a flash memory for storing an adjustment amount of the current adjustment circuit, and a control circuit for controlling the current amount flowing in the current adjustment circuit in accordance with the adjustment amount when a burn-in mode signal indicating a burn-in mode is supplied.
Claims13
A semiconductor device comprising:
- a current adjustment circuit capable of adjusting a current amount flowing in the current adjustment circuit itself;
- a storage circuit for storing an adjustment amount of the current adjustment circuit;
- and
- a control circuit for controlling the current amount flowing in the current adjustment circuit in accordance with the adjustment amount when a burn-in mode signal indicating a burn-in mode is supplied.
A current adjustment method in a plurality of semiconductor devices each including a current adjustment circuit capable of adjusting a current amount flowing in the current adjustment circuit itself, the current adjustment method comprising the steps of:
- measuring a power supply current value for each semiconductor device;
- calculating a junction temperature of each semiconductor device, using the measured power supply current value;
- setting a target temperature common to the semiconductor devices based on the calculated junction temperature of each semiconductor device;
- and
- controlling the current amount flowing in the current adjustment circuit included in each semiconductor device in accordance with each difference between each calculated junction temperature and the target temperature.
A current adjustment method in a semiconductor device in which a current adjustment circuit capable of adjusting a current amount flowing in the current adjustment circuit itself is provided in each circuit block, the current adjustment method comprising the steps of:
- measuring a current value for each circuit block;
- calculating a junction temperature for each circuit block, using the measured current value;
- setting a target temperature of each circuit block based on the calculated junction temperature of each circuit block;
- and
- controlling the current amount flowing in the current adjustment circuit included in each circuit block in accordance with each difference between the calculated junction temperature of each circuit block and the target temperature.
Dependencies are inferred from the claim text.