Examining apparatus, examining method and recording medium

An examining apparatus comprising:

• a sensor data acquiring unit to acquire sensor data from each targeted sensor included in a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility;
• a learning unit to learn an analysis model by using the sensor data from each targeted sensor;
• an examining unit to examine the facility by using the learned analysis model;
• and
• a user interface unit to input feedback on an examination result obtained by using the analysis model, wherein
• the learning unit learns the analysis model by further using the feedback.

A recording medium having recorded thereon a program that causes a computer to function as an examining apparatus comprising:

• a group designation acquiring unit to acquire designation of a targeted group including a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility;
• a sensor data acquiring unit to acquire sensor data from each targeted sensor included in the targeted group;
• a learning unit to learn an analysis model by using the sensor data from each targeted sensor included in the targeted group;
• and
• an examining unit to examine the facility by using the learned analysis model.

An examining method comprising:

• acquiring designation of a targeted group including a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility;
• acquiring sensor data from each targeted sensor included in the targeted group;
• learning an analysis model by using the sensor data from each targeted sensor included in the targeted group;
• and
• examining the facility by using the learned analysis model.