Systems and methods for extended depth-of-field microscopy
AssigneeArizona Board of Regents on Behalf of the University of Arizona
InventorsHong HUA, Sheng-Huei LU
Life of this patent
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Abstract
An extended depth-of field microscope includes (a) a microdisplay having an array of emitters capable of illuminating a sample with structured illumination, (b) an image sensor for capturing an image of the sample, and a microscope objective configured to direct the structured illumination toward the sample and direct light from the sample toward the image sensor, wherein the microscope objective has tunable focal length and is object-space telecentric such that tuning of the focal length does not substantially affect magnification of either one of the image formed on the image sensor and the structured illumination projected into object space.
Claims33
An extended depth-of field microscope, comprising:
- a microdisplay having an array of emitters capable of illuminating a sample with structured illumination;
- an image sensor for capturing an image of the sample;
- a microscope objective configured to direct the structured illumination toward the sample and direct light from the sample toward the image sensor, the microscope objective having tunable focal length and being object-space telecentric such that tuning of the focal length does not substantially affect magnification of (i) the image formed on the image sensor and (ii) the structured illumination projected into object space,
- a focal length controller for electrically tuning the focal length;
- and
- machine-readable instructions stored in non-transitory memory and configured to, upon execution by a processor, perform steps of:
- (a) commanding generation of the structured illumination via the microdisplay,
- (b) in cooperation with the focal length controller, electrically tuning the focal length to scan, across a depth range in object space, a common focal plane of the structured illumination and the image sensor,
- (c) while scanning the focal plane across the depth range, commanding the image sensor to acquire the image, and
- (d) initiating steps of projecting, electrically tuning, and acquiring for at least three different modulation patterns of the structured illumination, phase shifted from each other, to integrate at least three images, respectively.
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Deconvolution-free extended depth-of-field microscopy method, comprising:
- projecting structured illumination onto a sample through a microscope objective;
- tuning focal length of the microscope objective while maintaining constant magnification, to scan, across a depth range in object space, a common focal plane associated with (a) the structured illumination and (b) an image sensor for capturing an image of the sample through the microscope objective;
- while scanning the focal plane across the depth range, acquiring the image;
- performing the steps of projecting, tuning, and acquiring for at least three different modulation patterns of the structured illumination phase shifted from each other to integrate at least three images, respectively;
- combining the at least three images to generate a single extended depth-of-field image of the sample.
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Dependencies are inferred from the claim text.