US 2019/0162795 A1Published application

Testing fixture, testing system for cell temperature probe and method for testing cell temperature probe

AssigneeChroma Ate Inc.

InventorsChuan-Tse LIN, Ming-Tsung LIU, Kuan-Chen CHEN, Chien-Po LIN

Life of this patent

Estimating the term…

Loading patent…

Abstract

A testing fixture for a cell temperature probe includes a microcomputer, a temperature probe, a measurement case, a temperature instrument and heaters. The microcomputer configured to receive a control command for executing a testing process. The measurement case has an outer surface and an inner surface. The outer surface includes a probe-contacting area used for being contacted by the cell temperature probe within a formation device in the testing process. The temperature instrument is electrically connected to the microcomputer and has a sensing terminal disposed on the inner surface of the measurement case. The location of the sensing terminal is aligned with the probe-contacting area in a direction of a thickness of the measurement case. The heaters are electrically connected to the microcomputer and thermally to the measurement case.

Claims10

Dependent claims

A testing fixture for a cell temperature probe, adapted to a formation device and a central control system, with the formation device configured to perform a testing process according to a control command from the central control system, the testing fixture comprising:

a microcomputer communicatively connected to the central system and configured to receive the control command for performing the testing process;
a measurement case having an outer surface and an inner surface opposite to the outer surface, with the outer surface comprising a probe-contacting area adapted to be contacted by the cell temperature probe within the formation device during the testing process, so that a sensing temperature value related to the measurement case is obtained by the cell temperature probe;
a temperature instrument electrically connected to the microcomputer, with the temperature instrument having a sensing terminal disposed on the inner surface of the measurement case, and a location of the sensing terminal disposed in the inner surface is aligned with the probe-contacting area in a direction of a thickness of the measurement case;
and
a set of heaters electrically connected to the microcomputer and thermally connected to the measurement case.

2 more elements

A testing system for a cell temperature probe, comprising:

a central control system configured to generate a control command;
at least one formation device communicatively connected to the central control system, with each of the at least one formation device comprising a cell temperature probe and configured to perform a testing process according to the control command;
a testing fixture communicatively connected to the central control system and configured to receive the control command and selectively perform the testing process for one of the at least one formation device, with the testing fixture capable of detachably connecting to a compartment of the formation device, and the cell temperature probe adapted to contact a probe-contacting area within the testing fixture.

A method for testing cell temperature probes, comprising:

outputting a control command, by a central control system, to at least one formation device and a testing fixture, wherein each of the at least one formation device comprising a plurality of cell temperature probes;
and
performing a testing process according to the control command by the at least one formation device and the testing fixture;
wherein the testing process comprises:
connecting the testing fixture to a compartment of one of the at least one formation device detachably;
obtaining a respective one of a plurality of sensing temperature values by each of the plurality of cell temperature probes of the formation device;
obtaining a plurality of standard temperature values by the testing fixture, with each of the plurality of standard temperature values associated with a respective one of the plurality of cell temperature probes in a location;
sending at least portion of the plurality of standard temperature values back to the formation device by the testing fixture;
and
testing the plurality of cell temperature probes, by the formation device, according to the at least portion of the plurality of standard temperature values sent by the testing fixture and the at least portion of the plurality of sensing temperature values.

7 more elements

Dependencies are inferred from the claim text.

Facts

Application: 16/180,158Filed 5 Nov 2018
Priority: TW 10614091424 Nov 2017
Published: 30 May 2019
Term ends: Not estimatedThe source records don’t support an estimate.

Classification10 codes

G01R 31/3646
Constructional arrangements: for indicating electrical conditions or variables, e.g. visual or audible indicators
G01R 31/387
Arrangements for measuring battery or accumulator variables: determining ampere-hour charge capacity or SoC
G01R 31/396
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of…
G01R 35/00
Testing or calibrating of apparatus covered by the other groups of this