Semiconductor device test system and semiconductor device test method
AssigneeSamsung Electronics Co., Ltd.
InventorSung-Gu LEE
Life of this patent
Estimating the term…
Abstract
A semiconductor device test system and a semiconductor device test method are provided. The system includes a device under test (DUT) which provides an output voltage to a load connected to an output terminal, automatic test equipment (ATE) which supplies power to the DUT and measures the output voltage of the DUT, and a current mirror which is connected between the ATE and the DUT. The ATE outputs a reference current to the current mirror, and the DUT provides an output current to the current mirror. The output current is obtained by mirroring the reference current from the ATE.
Claims22
A semiconductor device test system comprising:
- a device under test (DUT) which provides an output voltage to a load connected to an output terminal;
- automatic test equipment (ATE) which supplies power to the DUT and measures the output voltage of the DUT;
- and
- a current mirror which is connected between the ATE and the DUT,
- wherein the ATE outputs a reference current to the current mirror, and the DUT provides an output current to the current mirror, the output current being obtained by mirroring the reference current from the ATE.
A semiconductor device test system comprising:
- a substrate;
- a current mirror which is mounted on the substrate to be electrically connected to an automatic test equipment (ATE) and receives a reference current from the ATE;
- and
- a device under test (DUT) which is mounted on the substrate and configured to be electrically connected to the current mirror and provides an output current to the current mirror, the output current being obtained by mirroring the reference current from the ATE.
13-14. (canceled)
A semiconductor device test system comprising:
- a current mirror which comprises an input terminal and an output terminal;
- and
- automatic test equipment (ATE) which provides a reference current to the current mirror and measures an output voltage of a DUT that outputs a current obtained by mirroring the reference current using the current mirror.
23-26. (canceled)
Dependencies are inferred from the claim text.