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US 2019/0162774 A1Published application
Testing device, testing system, and testing method
AssigneeAdvanced Semiconductor Engineering, Inc.
InventorsHung-Jen HUANG, Yen-Chun WANG, Chen-Kuo CHU, I-Chun LIU
Life of this patent
Estimating the term…
Abstract
A testing device includes a testing socket and a reflector. The testing socket defines an accommodating space. The reflector is disposed in the accommodating space and has a plurality of reflection surfaces non-parallel with each other. The reflection surfaces define a transmission space.
Claims20
A testing device, comprising:
- a testing socket defining an accommodating space;
- and
- a reflector disposed in the accommodating space and having a plurality of reflection surfaces non-parallel with each other, wherein the reflection surfaces define a transmission space.
A testing device, comprising:
- a testing fixture defining a first opening and a second opening opposite to the first opening, and having a plurality of reflection surfaces defining a transmission space between the first opening and the second opening;
- and
- a device holder disposed in the transmission space and defining an upper opening, the device holder including at least one first signal transmission portion and a second signal transmission portion, wherein the upper opening of the device holder corresponds to the first opening of the testing fixture, the first signal transmission portion and the second signal transmission portion define a receiving space, and the second signal transmission portion is opposite to the upper opening.
A testing system, comprising:
- a testing device comprising:
- a testing socket defining a first opening, a second opening opposite to the first opening and an accommodating space between the first opening and the second opening;
- a reflector disposed in the accommodating space and having a plurality of reflection surfaces;
- and
- a device holder disposed in the accommodating space and defining a receiving space to accommodate a device under test (DUT), wherein the device holder includes at least one first signal transmission portion and a second signal transmission portion;
- a circuit board disposed above the first opening of the testing socket and configured to electrically connect to the DUT;
- and
- a tester disposed under the second opening of the testing socket and electrically connected to the circuit board, and the tester including a test antenna corresponding to the second opening of the testing socket.
5 more elements
A testing method, comprising:
- (a) providing a test board and a DUT, the DUT including a first surface and a second surface opposite the first surface and a plurality of electrical contacts disposed adjacent to the first surface;
- and
- (b) applying suction on the first surface of the DUT so that the electrical contacts of the DUT are electrically connected to the test board.
Dependencies are inferred from the claim text.