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US 2019/0162767 A1Published application
Testing device, testing system, and testing method
AssigneeAse Test, Inc.
InventorsYEN-CHUN WANG, Hung-Jen HUANG, Chen-Kuo CHU, I-Chun LIU
Life of this patent
Estimating the term…
Abstract
A testing device includes a testing socket, a first transmission medium and a second transmission medium. The testing socket defines a radiation space. The first transmission medium is disposed in the radiation space of the testing socket. The first transmission medium is configured for supporting a device under test (DUT). The second transmission medium is disposed in the radiation space of the testing socket.
Claims30
A testing device, comprising:
- a testing socket defining a radiation space;
- a first transmission medium disposed in the radiation space of the testing socket, wherein the first transmission medium is configured for supporting a device under test (DUT);
- and
- a second transmission medium disposed in the radiation space of the testing socket.
1 more element
A testing device, comprising:
- a testing socket having an inner surface defining a radiation space, wherein the inner surface of the testing socket is a wave absorbing surface;
- and
- a device holder disposed in the radiation space of the testing socket, wherein the device holder defines an radiation space for receiving a device under test (DUT).
A testing system, comprising:
- a testing device, comprising:
- a testing socket defining a radiation space;
- a first transmission medium disposed in the radiation space of the testing socket, wherein the first transmission medium is configured for supporting a device under test (DUT);
- and
- a second transmission medium disposed in the radiation space of the testing socket.
- a circuit board disposed above the testing socket and configured to electrically connect to the DUT;
- a tester disposed under the testing socket and electrically connected to the circuit board;
- and
- a sub-system, comprising:
- an intermediate apparatus being in communication with the device under test (DUT);
- and
- an up/down converter electrically connected to the intermediate apparatus and the tester, wherein the up/down converter is configured for lowering or raising a frequency of a signal.
9 more elements
A testing method, comprising:
- (a) providing a test board and a device under test (DUT), the device under test (DUT) including a first surface and a second surface opposite the first surface and a plurality of electrical contacts disposed adjacent to the first surface;
- (b) applying suction on the first surface of the device under test (DUT) so that the electrical contacts of the DUT are electrically connected to the test board;
- and
- (c) providing a sub-system, wherein the sub-system includes an intermediate apparatus and an up/down converter, the intermediate apparatus is in communication with the device under test (DUT), the up/down converter is electrically connected to the intermediate apparatus and a tester, and the up/down converter is used for lowering or raising a frequency of a signal.
1 more element
Dependencies are inferred from the claim text.