Electrical signal measurement device using reference signal

A method of operating an electrical parameter measurement device, the electrical parameter measurement device comprising a housing, voltage measurement circuitry, a voltage test input terminal and a common input terminal operatively coupled to the voltage measurement circuitry, the method comprising:

• causing a common mode reference voltage source to generate an alternating current (AC) reference voltage having a reference frequency, the common mode reference voltage source being electrically coupled to the common input terminal;
• detecting, via detection circuitry of the electrical parameter measurement device, a first signal present at the voltage test input terminal;
• detecting, via the detection circuitry, a second signal present at the common input terminal;
• processing, via processing circuitry of the electrical parameter measurement device, the first and second signals;
• and
• determining, via the processing circuitry, at least one electrical characteristic of a device under test that is electrically coupled to the voltage test input terminal and the common input terminal based at least in part on the processing of the first and second signals.

An electrical parameter measurement device, comprising:

• a housing;
• voltage measurement circuitry disposed within the housing;
• a voltage test input terminal operatively coupled to the voltage measurement circuitry;
• a common input terminal operatively coupled to the voltage measurement circuitry;
• a common mode reference voltage source disposed within the housing and electrically coupled to the common input terminal, wherein, in operation, the common mode reference voltage source generates an alternating current (AC) reference voltage having a reference frequency;
• detection circuitry disposed within the housing, wherein, in operation, the detection circuitry detects first and second signals present at the voltage test input terminal and the common input terminal, respectively;
• and
• processing circuitry disposed within the housing, wherein, in operation, the processing circuitry processes the first and second signals to determine at least one electrical characteristic of a device under test that is electrically coupled to the voltage test input terminal and the common input terminal.