Semiconductor device and power monitoring method therefor
AssigneeRenesas Electronics Corporation
InventorsToshiki YAMAHIRA, Masahiro SAKAI
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AssigneeRenesas Electronics Corporation
InventorsToshiki YAMAHIRA, Masahiro SAKAI
Estimating the term…
According to an aspect of a present invention, there is provided a semiconductor device including a first power monitoring device and a second power monitoring device. The first power monitoring device outputs first operating power that is to be supplied to a second control section. The second power monitoring device outputs second operating power that is to be supplied to a first control section. Based on a first setting given from the first control section, a first power monitoring circuit autonomously verifies whether the second operating power is normal, and periodically transmits the result of verification to the second control section as first error information. Based on a second setting given from the second control section, a second power monitoring circuit autonomously verifies whether the first operating power is normal, and periodically transmits the result of verification to the first control section as second error information.
A semiconductor device comprising:
A semiconductor device comprising:
A power monitoring method that detects an abnormality in operating power supplied to a first control section and a second control section in a system for monitoring the operation of the same monitoring target circuit by using the first control section and the second control section, the power monitoring method comprising the steps of:
Dependencies are inferred from the claim text.