Ion mobility analyzer and analysis method
AssigneeShimadzu Research Laboratory (Shanghai) Co. Ltd.
InventorsKent James GILLIG, Keke WANG, Wenjian SUN, Xiaoqiang ZHANG
Life of this patent
Estimating the term…
Loading patent…
AssigneeShimadzu Research Laboratory (Shanghai) Co. Ltd.
InventorsKent James GILLIG, Keke WANG, Wenjian SUN, Xiaoqiang ZHANG
Estimating the term…
The invention provides ion mobility analyzer and analysis method. The analyzer includes an ion source, a first drift/analyzer region provided with an ions entrance, a second drift/analyzer region provided with an ions exit, a connection region connecting the first drift/analyzer region and the second drift/analyzer region, and a detector connected to the ion exit. Direct current electric fields and gas flows in the first drift/analyzer region and the second drift/analyzer region apply opposing forces on ions, and first and second gas flows have the same gas flow direction. The connection region includes a third direct current electric field that causes ions to transfer from the first drift/analyzer region to the second drift/analyzer region. Because the first and second regions have the same gas flow direction, the invention achieves stable resolution and sensitivity as a high-resolution ion mobility analyzer and/or an ion mobility filter for a continuous ion beam.
An ion mobility analyzer, comprising:
An ion mobility analysis method for separating and identifying ionic analytes, comprising:
Dependencies are inferred from the claim text.