Misalignment compensation in dual x-ray imager
AssigneeVarex Imaging Corporation
InventorsIvan MOLLOV, Eric AMUSIN, Arundhuti GANGULY
Life of this patent
Estimating the term…
Abstract
An X-ray sensing apparatus includes a first photodiode array for imaging a first area, a second photodiode array for imaging a second area that overlaps a portion of the first area, and a light-blocking layer coupled to the first photodiode array that prevents at least a portion of visible light emitted by a scintillator layer of the X-ray sensing apparatus from reaching the second photodiode array. The light-blocking layer includes a first feature that is imagable by the second photodiode array and indicates a position along a first direction and a second feature that is imagable by the second photodiode array and indicates a position along a second direction that is different than the first direction.
Claims23
A method in an X-ray sensing apparatus including a first photodiode array for imaging a first area and a second photodiode array for imaging a second area that overlaps a portion of the first area, the method comprising:
- with the second photodiode array, generating a second digital image of the second area and an object that is fixed to the first photodiode array and prevents at least a portion of visible light emitted from a scintillator layer in the X-ray sensing apparatus from reaching the second photodiode array;
- determining a position of the object relative to the second photodiode array based on the second digital image;
- and
- generating an offset correction for a position of the first photodiode array relative to the second photodiode array based on the position of the object.
An X-ray sensing apparatus, comprising:
- a first photodiode array for imaging a first area;
- a second photodiode array for imaging a second area that overlaps a portion of the first area;
- and
- a light-blocking layer coupled to the first photodiode array that prevents at least a portion of visible light emitted by a scintillator layer of the X-ray sensing apparatus from reaching the second photodiode array, wherein the light-blocking layer includes a first feature that is imagable by the second photodiode array and indicates a first position and a second feature that is imagable by the second photodiode array and indicates a second position that is different than the first position.
A method in an X-ray sensing apparatus including a first photodiode array that images a first area and a second photodiode array that images a second area overlapping a portion of the first area, the method comprising:
- with the first photodiode array, generating a first digital image of a first location indicator and a second location indicator;
- with the second photodiode array, generating a second digital image of the first location indicator and the second location indicator;
- and
- determining an alignment offset between the first photodiode array and the second photodiode array, based on a location of the first location indicator in the first digital image, a location of the second location indicator in the first digital image, a location of the first location indicator in the second digital image, and a location of the second location indicator in the second digital image.
A method in an X-ray sensing apparatus including a photodiode array for imaging an area and a scintillator layer, the method comprising:
- with the photodiode array, generating a digital image of the area and an object that is fixed to an external housing of the X-ray sensing apparatus and prevents at least a portion of visible light emitted from a scintillator layer included in the X-ray sensing apparatus from reaching the photodiode array, wherein the object is disposed between the scintillator layer and the photodiode array;
- determining a position of the object relative to the photodiode array based on the digital image;
- and
- generating an offset correction for a position of the photodiode array relative to the external housing of the X-ray sensing apparatus based on the position of the opaque object.
Dependencies are inferred from the claim text.