Apparatus for x-ray imaging an object

A system for X-ray imaging an object, comprising:

• an apparatus for imaging an object comprising:
• at least one X-ray source;
• an X-ray interferometer arrangement;
• an X-ray detector;
• wherein the X-ray detector is configured to be positioned relative to the at least one X-ray source such that at least a part of a region between the at least one X-ray source and the X-ray detector is an examination region for accommodating the object;
• wherein the X-ray interferometer arrangement comprises a first grating and a second grating;
• wherein in a first mode of operation the at least one X-ray source is configured to produce a first focal spot, and the at least one X-ray source is configured to produce X-rays such that at least some first X-rays produced at the first focal spot pass through the first grating at a first position and pass through the second grating at a second position, wherein the X-ray detector is configured to detect the at least some first X-rays;
• and
• wherein in a second mode of operation the at least one X-ray source is configured to produce a second focal spot, and the at least one X-ray source is configured to produce X-rays such that at least some second X-rays produced at the second focal spot avoid the first grating at the first position, wherein the X-ray detector is configured to detect the at least some second X-rays;
• a processor;
• and
• an output unit;
• wherein the processor is configured to control the apparatus and the output unit;
• wherein the X-ray detector is configured to provide the processor with data relating to the detection of X-rays;
• and
• wherein the output unit is configured to output data representative of the object.

A method for X-ray imaging an object, comprising:

• positioning an X-ray detector relative to at least one X-ray source, such that at least a part of a region between the at least one X-ray source and the X-ray detector is an examination region for accommodating an object;
• producing, by the at least one X-ray source in a first mode of operation, a first focal spot, such that at least some first X-rays produced at the first focal spot pass through a first grating of an interferometer arrangement, the first grating positioned at a first position, and such that the at least some first X-rays pass through a second grating of the interferometer arrangement, the second grating positioned at a second position;
• detecting, by the X-ray detector in the first mode of operation, the at least some first X-rays;
• producing, by the at least one X-ray source in a second mode of operation, a second focal spot, such that at least some second X-rays produced at the second focal spot avoid the first grating at the first position;
• and
• detecting, by the X-ray detector in the second mode of operation, the at least some second X-rays.

A non-transitory computer-readable medium having one or more executable instructions stored thereon, which when executed by a processor, cause the processor to perform a method for X-ray imaging an object, the method comprising:

• positioning an X-ray detector relative to at least one X-ray source such that at least a part of a region between the at least one X-ray source and the X-ray detector is an examination region for accommodating an object;
• producing, by the at least one X-ray source in a first mode of operation, a first focal spot, such that at least some first X-rays produced at the first focal spot pass through a first grating of an interferometer arrangement, the first grating positioned at a first position, and such that the at least some first X-rays pass through a second grating of the interferometer arrangement, the second grating positioned at a second position;
• detecting, by the X-ray detector in the first mode of operation, the at least some first X-rays;
• producing, by the at least one X-ray source in a second mode of operation, a second focal spot, such that at least some second X-rays produced at the second focal spot avoid the first grating at the first position;
• and
• detecting, by the X-ray detector in the second mode of operation, the at least some second X-rays.