A method for manufacturing a photovoltaic device
AssigneeNewSouth Innovations Pty Limited
InventorsBrett Jason HALLAM, Stuart Ross WENHAM, Roland EINHAUS
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Abstract
The present disclosure provides methodologies for manufacturing high efficiency silicon photovoltaic devices using hydrogen passivation to improve performance. The processing techniques disclosed use tailored thermal processes, sometimes coupled with exposure to radiation to enable the use of cheaper silicon material to manufacture high efficiency photovoltaic devices.
Claims21
A method for forming a homo-junction silicon photovoltaic device, the method comprising the steps of:
- providing a substrate comprising doped silicon material with a first polarity;
- forming a region of silicon material with a second polarity into the doped silicon material;
- the second polarity being opposite to the first polarity;
- performing a first hydrogen passivation process at a temperature above 500° C. in a manner such that excess minority carriers are generated in the silicon material;
- forming metallic contacts to extract charge carriers from the silicon material;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the silicon material;
- wherein the first or the second hydrogen passivation process enables passivation of electrically active defects in the bulk region of the silicon material.
A method for forming a silicon hetero-junction photovoltaic device, the method comprising the steps of:
- providing a substrate comprising doped silicon material with a first polarity;
- performing a first hydrogen passivation process to the substrate at a temperature above 500° C. in a manner such that excess minority carriers are generated in the silicon material;
- subsequent to performing the first hydrogen passivation, forming a first layer of intrinsic amorphous silicon onto a first surface of the substrate;
- forming a layer of doped amorphous silicon material with a first polarity onto a portion of the first layer;
- forming a second layer of intrinsic amorphous silicon onto a second surface of the substrate;
- the second surface being opposite to the first surface;
- forming a layer of doped amorphous silicon material with a second polarity onto a portion of the second layer;
- the second polarity being opposite to the first polarity;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the amorphous silicon material;
- wherein the first or the second hydrogen passivation process enables passivation of electrically active defects in the bulk region of the silicon material.
A method for forming a hybrid silicon photovoltaic device, the method comprising the steps of:
- providing a substrate comprising doped silicon material;
- forming a region of silicon material with a first polarity into the doped silicon material on a first surface of the substrate;
- and
- performing a first hydrogen passivation process at a temperature above 500° C. in a manner such that excess minority carriers are generated in the silicon material;
- subsequent to performing a first hydrogen passivation, forming a layer of intrinsic amorphous silicon on a second surface of the substrate;
- the second surface being different to the first surface;
- forming a layer of doped amorphous silicon material with the second polarity onto a portion of the layer of intrinsic amorphous silicon;
- the second polarity being opposite to the first polarity;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the amorphous silicon material;
- wherein the first or the second hydrogen passivation process enables passivation of electrically active defects in the bulk region of the silicon material.
A method for forming a poly-silicon photovoltaic device, the method comprising the steps of:
- providing a substrate;
- forming a first layer of poly-silicon with a first polarity onto a first region of the substrate;
- forming a second layer of poly-silicon with a second polarity onto a second region of the substrate;
- the second polarity being opposite to the first polarity;
- and
- performing a first hydrogen passivation process at a temperature above 500° C. in a manner such that excess minority carriers are generated in the silicon material;
- forming metallic contacts to extract charge carriers from the first and the second layer of poly-silicon;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the poly-silicon material;
- the second hydrogen passivation process comprising the step of exposing the device to electromagnetic radiation;
- the electromagnetic radiation being such that photons with an energy higher than a bandgap of the poly-silicon material provide a power density of at least 10 mW/cm2;
- wherein the first or the second hydrogen passivation process enables passivation of electrically active defects in the bulk region of the silicon material.
A method for forming a hybrid silicon photovoltaic device, the method comprising the steps of:
- providing a substrate comprising doped silicon material;
- forming a region of silicon material with a first polarity into the doped silicon material on a first surface of the substrate;
- and
- forming a layer of poly-silicon with a second polarity on a second surface of the substrate;
- the second polarity being opposite to the first polarity;
- the second surface being opposite to the first surface;
- forming a dielectric layer that contains hydrogen on the region with the first polarity;
- subsequent to forming the dielectric layer, performing a first hydrogen passivation process at a temperature above 500° C. in a manner such that excess minority carriers are generated in the silicon material;
- the first hydrogen passivation process comprising the step of exposing the device to electromagnetic radiation;
- the electromagnetic radiation being such that photons with an energy higher than a bandgap of the poly-silicon material provide a power density of at least 10 mW/cm2;
- forming metallic contacts to extract charge carriers from the first and the second layer of poly-silicon;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the poly-silicon material;
- wherein the first or the second hydrogen passivation process enables passivation of electrically active defects in the bulk region of the silicon material.
A method for forming a photovoltaic device, the method comprising the steps of:
- providing a silicon substrate;
- performing a first hydrogen passivation process at a temperature above 500° C. in a manner such that excess minority carriers are generated in the silicon;
- forming a carrier selective layer on a first region of the substrate;
- the carrier selective layer being such to minimise flow of carriers with a first polarity through the layer;
- forming metallic contacts to extract charge carriers from the carrier selective layer;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the silicon;
- the second hydrogen passivation process comprising the step of exposing the device to electromagnetic radiation;
- the electromagnetic radiation being such that photons with an energy higher than a bandgap of the silicon material provide a power density of at least 10 mW/cm2;
- wherein the first or the second hydrogen passivation process enables passivation of electrically active defects in the bulk region of the silicon material.
A method for forming a photovoltaic device, the method comprising the steps of:
- providing a silicon substrate;
- forming at least one hetero-junction structure a first region of the substrate;
- the hetero-junction structure being arranged to generate excess carrier when exposed to radiation;
- performing a first hydrogen passivation process at a temperature above 500° C. in a manner such that excess minority carriers are generated in the hetero-junction structure;
- forming metallic contacts to extract charge carriers from the hetero-junction structure;
- and
- performing a second hydrogen passivation process at a temperature below 500° C. in a manner such that excess minority carriers are generated in the hetero-junction structure;
- the second hydrogen passivation process comprising the step of exposing the device to electromagnetic radiation;
- the electromagnetic radiation being such that photons with an energy higher than a bandgap of the hetero-junction material provide a power density of at least 10 mW/cm2;
- wherein the first hydrogen passivation process enables diffusion of hydrogen through the silicon and the second hydrogen passivation process enables passivation of electrically active defects in the hetero-junction.
21-29. (canceled)
Dependencies are inferred from the claim text.