Bulk finfet with self-aligned bottom isolation

Abstract

Aspects of the disclosure are directed to a semiconductor device. The semiconductor device may include a plurality of fins formed on a semiconductor substrate including a bulk semiconductor material, a plurality of shallow trench isolation (STI) trenches formed between the plurality of fins, a hardmask formed around the plurality of fins, and a plurality of fin bottom portions formed below the plurality of fins.

Dependencies are inferred from the claim text.