Fabrication of process-equivalent test specimens of additively manufactured components
AssigneeUnited Technologies Corporation
InventorsRebecca L. Runkle, Anthony Patrick Ventura, Thomas Anthony Rebbecchi
Life of this patent
Estimating the term…
Abstract
A method of fabricating process-equivalent test specimens to an additively manufactured component includes generating a processing history model of a component, dividing the component into regions based on input data variations in processing history, wherein each region is characterized by an identified range of input data, determining additive manufacturing processing parameters needed to additively manufacture one or more test specimens that each mimic the processing history in one of the regions, and fabricating the one or more test specimens using the processing parameters determined.
Claims20
A method of fabricating process-equivalent test specimens to an additively manufactured component, the method comprising:
- generating a processing history model of a component;
- dividing the component into regions based on input data variations in processing history, wherein each region is characterized by an identified range of input data;
- determining additive manufacturing processing parameters needed to additively manufacture one or more test specimens that each mimic the processing history in one of the regions;
- and
- fabricating the one or more test specimens using the processing parameters determined.
An additive manufacturing system for fabricating test specimens, the system comprising:
- an additive manufacturing machine for fabricating a component and test specimens;
- a sensor for detecting in-situ sensed data throughout a build process;
- a processor that performs the steps of:
- generating a processing history model of the component wherein input data comprising in-situ sensor data and/or processing metrics is mapped to the component geometry;
- using the input data from a first identified region of the component geometry to produce a transfer function that translates the input data obtained from the first identified region of the component to a machine processing routine used to fabricate a test specimen that mimics the processing history of the first identified region of the component;
- wherein processing metrics are derived from the in-situ sensor data or from a computational model of an additive manufacturing process of the component.
Dependencies are inferred from the claim text.