Mirror via conductivity for dmd pixel
AssigneeTexas Instruments Incorporated
InventorsLucius M. SHERWIN, Jesse YUAN, Noppawan BOORANANUT
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AssigneeTexas Instruments Incorporated
InventorsLucius M. SHERWIN, Jesse YUAN, Noppawan BOORANANUT
Estimating the term…
A method includes forming a first aluminum silicon layer on a metal layer and forming a titanium nitride layer (or other titanium-based layer) on a surface of the aluminum-silicon layer opposite the metal layer. The method further includes etching the titanium nitride layer to create a titanium nitride pad and forming a torsion hinge in the metal layer. The titanium nitride pad is on the torsion hinge. The method also includes depositing a sacrificial layer over the torsion hinge and titanium nitride pad, forming a via in the sacrificial layer from a surface of the sacrificial layer opposite the torsion hinge to the titanium nitride pad, depositing a metal mirror layer on a surface of the sacrificial layer opposite the torsion hinge and into the via, and removing the sacrificial layer.
A method, comprising:
A method, comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.