Machine vision method and system for monitoring manufacturing processes

A method, comprising:

• monitoring a first object in a first operating mode of a machine vision system comprising at least one lighting device, at least one image sensor and a data processing device, wherein the monitoring in a first operating mode comprises illuminating a first object by said at least one lighting device using a first type of illumination and capturing images of the first object by said at least one image sensor at a first image capturing frequency, and wherein the first object is arranged at least partly on a second object;
• transmitting the captured image data of the captured images to the data processing device for analysis;
• and
• wherein the method further comprises changing the machine vision system for monitoring the second object in a second operating mode and for transmitting the captured image data of the captured images to the data processing device for analysis, if absence of the first object on the second object is detected from the image data captured in the first operating mode by the data processing device, wherein in the second operating mode the data processing device is arranged to detect deviations from the image data captured of the second object with image analyzing parameters reconfigured to be suitable for detecting deviations in the second object to be monitored.