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AssigneeHeinrich Georg GmbH Maschinenfabrik
InventorsArian Zeppenfeld, Günter Klappert, Jost Friedrich, Volker Loth
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The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (24), wherein the inspection system comprises a detection unit (26), a conveyance device (27) and a processing device, wherein the detection unit includes an optical detecting device (31), wherein the conveyance device is used to continuously transport a plurality of transformer laminations (25) relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device (40) of the detection unit, wherein an image of a contour of a transformer lamination is captured with the detecting device, wherein images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, wherein a shape of the transformer lamination is determined on the basis of the combined image via the processing device.
A method for analysing defects in transformer laminations with an inspection system, wherein the inspection system comprises a detection unit, a conveyance device and a processing device, wherein the detection unit includes an optical detecting device, wherein the conveyance device is used to continuously transport a plurality of transformer laminations relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device of the detection unit, an image of a contour of a transformer lamination is captured with the detecting device, images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, and a shape of the transformer lamination is determined on the basis of the combined image via the processing device.
An inspection system for analysing defects in transformer laminations, wherein the inspection system comprises a detection unit, a conveyance device and a processing device, wherein the detection unit includes an optical detecting device, wherein the conveyance device is used to continuously transport a plurality of transformer laminations relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device of the detection unit, an image of a contour of a transformer lamination is captured with the detecting device, images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, and a shape of the transformer lamination is determined on the basis of the combined image via the processing device.
Dependencies are inferred from the claim text.