Method for forming vias and method for forming contacts in vias
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTzu-Yang LIN, Cheng-Han WU, Ching-Yu CHANG, Chin-Hsiang LIN
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTzu-Yang LIN, Cheng-Han WU, Ching-Yu CHANG, Chin-Hsiang LIN
Estimating the term…
A method for forming openings in an underlayer includes: forming a photoresist layer on an underlayer formed on a substrate; exposing the photoresist layer; forming photoresist patterns by developing the exposed photoresist layer, the photoresist patterns covering regions of the underlayer in which the openings are to be formed; forming a liquid layer over the photoresist patterns; after forming the liquid layer, performing a baking process so as to convert the liquid layer to an organic layer in a solid form; performing an etching back process to remove a portion of the organic layer on a level above the photoresist patterns; removing the photoresist patterns, so as to expose portions of the underlayer by the remaining portion of the organic layer; forming the openings in the underlayer by using the remaining portion of the organic layer as an etching mask; and removing the remaining portion of the organic layer.
A method for forming openings in an underlayer, the method comprising:
A method for forming openings in a first underlayer, the method comprising:
A method for forming contacts in a dielectric layer, the method comprising:
Dependencies are inferred from the claim text.