Apparatus and method to reduce vignetting in microscopic imaging
AssigneeNanotronics Imaging, Inc.
InventorsMatthew C. Putman, John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer
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AssigneeNanotronics Imaging, Inc.
InventorsMatthew C. Putman, John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer
Estimating the term…
A method for altering the intensity of light across the field of view of an image sensor in a microscope apparatus having a light source, an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor includes interposing a programmable spatial light modulator, pSLM, in the light path between the light source and the image sensor, the pSLM having a plurality of pixels; and modulating the intensity of light passing through one or more pixels of the plurality of pixels of the pSLM to produce an altered illumination landscape at the field of view of the image sensor that differs from an unaltered illumination landscape that would otherwise be produced at the image sensor. Vignetting can be specifically addressed.
A method for correcting the intensity of light across the field of view of an image sensor in a microscope apparatus to correct for the vignetting of light from a light source of the microscope apparatus, the microscope apparatus including an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor the method comprising the steps of:
A method for altering the intensity of light across the field of view of an image sensor in a microscope apparatus having a light source, an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor the method comprising the steps of:
Dependencies are inferred from the claim text.