Back end of line process integrated optical device fabrication
AssigneeElenion Technologies, LLC
InventorsRuizhi Shi, Michael J. Hochberg, Ari Jason Novack, Thomas Wetteland Baehr-Jones
Life of this patent
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Abstract
An integrated optical device fabricated in the back end of line process located within the vertical span of the metal stack and having one or more advantages over a corresponding integrated optical device fabricated in the silicon on insulator layer.
Claims21
1-20. (canceled)
A method of integrated optical device fabrication forming an optical device within a vertical span of a metal stack of an integrated semiconductor chip as part of a back end of line fabrication process, comprising:
- providing a substrate;
- providing a device layer including at least one optical device on the substrate;
- depositing a first oxide layer over the semiconductor devices;
- forming a first metal via through the first oxide layer into contact with the device layer;
- depositing a second oxide layer comprising an oxide material over the first oxide layer;
- etching a first portion of the second oxide layer;
- depositing metal in the first portion of the second oxide layer for connection with the first metal via and external contacts;
- forming a second portion of the second oxide layer into a first waveguide for coupling light to or from the at least one optical device.
A method of integrated optical device fabrication forming an optical device within a vertical span of a metal stack of an integrated semiconductor chip as part of a back end of line fabrication process, comprising:
- providing a substrate;
- providing a device layer including at least one integrated optical device on the substrate;
- depositing a first oxide layer over the semiconductor devices;
- forming a first metal via through the first oxide layer into contact with the device layer;
- depositing a first stop layer over the first oxide layer;
- depositing a second oxide layer comprising an oxide material over the first stop layer;
- etching a first portion of the second oxide layer down to the first stop layer;
- depositing metal in the first portion of the second oxide layer for connection with the first metal via and external contacts;
- forming a portion of the first stop layer into a first waveguide for coupling light to or from the at least one integrated optical device.
An integrated semiconductor device, comprising:
- a substrate;
- a device layer on the substrate;
- a first oxide layer over the device layer;
- a second oxide layer over the first oxide layer;
- a third oxide layer over the second oxide layer;
- a fourth oxide layer over the third oxide layer;
- a fifth oxide layer over the fourth oxide layer
- a metal stack for connection with external contacts, including a first metal portion in a first portion of the second oxide layer extending between the first and third oxide layers, and a first metal via extending between the first metal portion and the device layer, and a second metal portion in a first portion of the fourth oxide layer extending between the third and fifth oxide layers, and a second metal via extending between the second metal portion and the device layer;
- an optical coupler including a first waveguide in a second portion of the third oxide layer, and a second waveguide in a second portion of the fifth oxide layer for coupling light to or from the at least one device layer.
Dependencies are inferred from the claim text.