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US 2019/0101591 A1Published application
Current Leakage And Charge Injection Mitigating Solid State Switch
AssigneeKeithley Instruments, LLC
InventorsMatthew Holtz, James Niemann, Martin Rice
Life of this patent
Estimating the term…
Abstract
Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.
Claims20
A test and measurement switch matrix comprising:
- a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system, the solid state switch including an input (switch_in) and an output (switch out);
- an input guard switch coupled to the switch_in of the solid state switch, the input guard switch to apply a guard voltage to the solid state switch when the solid state switch is off;
- and
- an output guard switch coupled to the switch_out of the solid state switch to apply the guard voltage when the solid state switch is off.
1 more element
An apparatus comprising:
- an input guard switch including a source coupled to a switch matrix input, a drain, and a gate;
- a input guard switch optical isolator coupled to the gate of the input guard switch;
- a solid state switch including an input (switch_in) coupled to the drain of the input guard switch, an output (switch_out), and a gate;
- a switch optical isolator coupled to the gate of the solid state switch;
- an output guard switch including a source coupled to the switch_out of the solid state switch, a drain coupled to a switch matrix output, and a gate;
- and
- a output guard switch optical isolator coupled to the gate of the output guard switch.
4 more elements
A method comprising:
- transmitting, by a switch drive, an open switch signal to the switch matrix to open a solid state switch coupled between an input guard switch and an output guard switch in a test and measurement switch matrix, the solid state switch to provide voltage isolation and the input guard switch and the output guard switch to mitigate current leakage, the open switch signal to disconnect a test signal from a Device Under Test (DUT) to a test and measurement system;
- and
- transmitting, by a guard drive, an open guard signal to the input guard switch and the output guard switch, the open guard signal to open the input guard switch and the output guard switch and apply a guard input voltage to the solid state switch when the solid state switch is in an off state.
Dependencies are inferred from the claim text.