Electronic component handling apparatus and electronic component testing apparatus

Abstract

[Object] Provided is an electronic component handling apparatus capable of improving test quality. [Solving Means] An electronic component handling apparatus 20 handling a DUT 90 having a temperature detection circuit 92 and pressing the DUT 90 against a socket 11 electrically connected to a tester 10 includes: a temperature adjuster 40 adjusting a temperature of the DUT 90, a first receiver 51 receiving a first signal indicating a junction temperature Tj of the DUT 90 from the tester 10, a second receiver 52 receiving a second signal indicating a detection value Tj+c of the temperature detection circuit 92 from the tester 10, a first calculator 54 calculating a temperature Tj′ of the DUT 90 by using the first signal and the second signal, and a temperature controller 55 controlling the temperature adjuster 40 on the basis of a calculation result of the first calculator 54.

Dependencies are inferred from the claim text.