Measurement system and method for performing test measurements
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsCorbett Rowell, Vincent Abadie, Benoit Derat
Life of this patent
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Abstract
A measurement system for testing a device under test is described that comprises at least one signal unit for processing a signal, at least two measurement antennas, at least two reflectors, a shielded space, and a testing position for the device under test. Each measurement antenna is orientated with respect to the testing position such that the testing position is located in at least one of a side lobe area and a back lobe area of the measurement antennas. The reflectors are located such that each reflector generates and/or collimates a planar wave at different angles with respect to the testing position. Further, a method for performing test measurements is described.
Claims18
A measurement system for testing a device under test comprising:
- at least one signal unit configured to process a signal, at least two measurement antennas, at least two reflectors, a shielded space, and a testing position for said device under test, each measurement antenna being orientated with respect to said testing position such that said testing position is located in at least one of a side lobe area and a back lobe area of said measurement antennas, and said reflectors being located such that each reflector at least one of generates and collimates a planar wave at different angles with respect to said testing position.
A method for performing test measurements of a device under test by using a measurement system comprising at least two reflectors, two measurement antennas and a testing location for said device under test, with the following steps:
- providing or receiving at least one data stream via said measurement antennas;
- and
- providing or collimating a planar wave at different angles with respect to said testing location via said reflectors.
Dependencies are inferred from the claim text.