Measuring device and measuring method with selective storage of data segments
AssigneeRohde & Schwarz GmbH & Co. KG
InventorThomas GUENTHER
Life of this patent
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Abstract
A measuring device comprises a first interface, which is adapted to receive a first measuring signal. The measuring device further comprises an acquisition memory, which is adapted to store at least one data segment of the first measuring signal. The measuring device further comprises an analyzer, which is connected to the acquisition memory, and is adapted to analyze the at least one data segment of the first measuring signal and generate a first analysis result therefrom. The measuring device further comprises a memory controller, which is adapted to either keep, in the acquisition memory, or discard, the at least one data segment based upon the first analysis result.
Claims18
A measuring device comprising:
- a first interface adapted to receive a first measuring signal;
- an acquisition memory adapted to store at least one data segment of the first measuring signal;
- a processor, connected to the acquisition memory, adapted to analyze the at least one data segment of the first measuring signal, and to generate a first analysis result based on the analysis of the at least one data segment of the first measuring signal;
- and
- a memory controller adapted to control the acquisition memory, based on the first analysis result, either to maintain the at least one data segment of the first measuring signal therein or to discard the at least one data segment of the first measuring signal.
A measuring method comprising:
- receiving, by a measuring device, a first measuring signal;
- storing, within a memory of the measuring device, at least one data segment of the first measuring signal;
- analyzing the at least one data segment of the first measuring signal;
- generating a first analysis result based on the analysis of the at least one data segment of the first measuring signal;
- and
- maintaining the at least one data segment of the first measuring signal within the memory of the measuring device or discarding the at least one data segment of the first measuring signal, based on the first analysis result.
Dependencies are inferred from the claim text.