Probe assembly and capacitive probe thereof
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsCHIH-PENG HSIEH, WEI-JHIH SU
Life of this patent
Estimating the term…
Abstract
The instant disclosure provides a probe assembly and a capacitive probe thereof. The capacitive probe includes a probe structure, a conductive structure and a dielectric structure. The probe structure includes a first end portion, a second end portion corresponding to the first end portion, and a connecting portion connected between the first end portion and the second end portion. The conductive structure is disposed on one side of the probe structure. The dielectric structure is disposed between the probe structure and the conductive structure.
Claims12
A capacitive probe, comprising:
- a probe structure having a first end portion, a second end portion corresponding to the first end portion, and a connecting portion connected between the first end portion and the second end portion;
- a conductive structure disposed at one side of the probe structure;
- and
- a dielectric structure disposed between the probe structure and the conductive structure.
A probe assembly, comprising:
- a transfer board having a plurality of accommodating grooves;
- a probe carrying seat disposed on the transfer board;
- and
- a plurality of capacitive probes disposed on the probe carrying seat, the plurality of capacitive probes being respectively disposed in the plurality of accommodating grooves, wherein each of the capacitive probes includes a probe structure, a conductive structure and a dielectric structure;
- wherein the conductive structures of each of the capacitive probes are electrically connected to the transfer board, the probe structure has a first end portion, a second end portion corresponding to the first end and a connecting portion connected between the first end portion and the second end portion, the conductive structure is disposed at one side of the probe structure, and the dielectric structure is disposed between the probe structure and the conductive structure.
Dependencies are inferred from the claim text.