Analysis apparatus and analysis method
AssigneeHoriba, Ltd.
InventorsKyoji SHIBUYA, Kensuke FUKUSHIRO, Toshio OHTA, Katsumi NISHIMURA
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AssigneeHoriba, Ltd.
InventorsKyoji SHIBUYA, Kensuke FUKUSHIRO, Toshio OHTA, Katsumi NISHIMURA
Estimating the term…
The present invention relates to an analysis apparatus adapted to analyze a measurement target component contained in a sample by irradiating a measurement cell into which the sample is introduced with pulse-oscillated light, whereby suppressing reduction in wavelength resolution without shortening the pulse width. The analysis apparatus includes multiple light sources adapted to produce pulse oscillations, a light detector adapted to detect light emitted from the light source and transmitted through the measurement cell, and a signal separation part adapted to separate, from a light intensity signal obtained by the light detector, signals corresponding to a part of pulses from the light sources.
An analysis apparatus adapted to analyze a measurement target component contained in a sample by irradiating a measurement cell into which the sample is introduced with pulse-oscillated light, the analysis apparatus comprising:
An analysis method adapted to analyze a measurement target component contained in a sample by irradiating a measurement cell into which the sample is introduced with pulse-oscillated light, the analysis method
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