System and method for 3d profile determination using model-based peak selection

A method for determining a profile on a surface of an object comprising the steps of:

• projecting a line of illumination on the surface and receiving reflected light at a sensor assembly at a set exposure level;
• varying the exposure level setting in a plurality of discrete increments and respectively storing an image of the reflected light for each of the increments;
• combining the stored images and aligning the combined images with respect to a model image;
• and
• selecting points from the combined images based upon proximity to the model image to provide a candidate profile of the surface.

A system for determining a profile on a surface of an object comprising:

• a displacement sensor that projects a line of illumination on the surface and receives reflected light at a sensor assembly at a set exposure level;
• a processor that varies the exposure level setting in a plurality of discrete increments, and that stores an image of the reflected light for each of the increments;
• and
• a determination process that combines the stored images to generate a 2D image therefrom and that aligns the 2D with respect to a model image.